Key details
Professor Stoyan Stoyanov
Reader in Computational Engineering and Optimisation
Professor Stoyan Stoyanov is Reader in Computational Engineering and Head of the Computational Mechanics and Reliability Group (CMRG) at the School of Computing and Mathematical Sciences. He received his MSc degree in applied mathematics from Sofia University and obtained a PhD degree in computational engineering at the Çï¿ûÊÓƵ in 2004. He holds NVQ Level 4 in Management from the Chartered Management Institute (2008) and became a Fellow of the Higher Education Academy (FHEA) in 2017.
Stoyan’s research interests and expertise are in the development and application of modelling and simulation technologies for numerical analysis of the performance and thermo-mechanical reliability of electronic products and microsystems, computational mechanics, physics-of-failure modelling, manufacturing and assembly process simulation, prognostics modelling, design optimisation, and computational intelligence.
Over the past 20 years, he worked on research and knowledge exchange projects with a focus on microelectronics design and advanced electronics packaging, electronics manufacturing, component assembly optimisation, quality and reliability assessment of electronics deployed in high-reliability and power applications, and industrial data analytics. Stoyan has collaborated with many national and international academic and industrial partners such as Leonardo Electronics, Microchip Technology, Hanwha-Phasor and Rolls Royce.
Posts Held Previously
- 2007-2010, Senior Research Fellow, Çï¿ûÊÓƵ
- 2004-2007, Research Associate (KTP), Çï¿ûÊÓƵ
- 2002-2004, Research Fellow, Çï¿ûÊÓƵ
Awards
Selected Awards
- IEEE Electronics Packaging Society “Achievement Certificate” (2021)
- Best paper awards at international conferences
- IEEE EuroSIME conference, Malta (2022)
- IEEE ITHERM conference, USA (2020)
- IEEE EMPC conference, Italy (2019)
- Fraunhofer Direct Digital Manufacturing Conference, Germany (2016)
- Winner of the National Times Higher Education Award for Outstanding Engineering Research Team of the Year (2009)
- Knowledge Transfer Collaboration award, London Development Agency (2008)
- Çï¿ûÊÓƵ 2008 Early Career Research Excellence Award
- Best Partnership Award for KTP, Technology Strategy Board (Innovate UK) (2008)
- IEEE CPMT (EPS) society certificate for significant contribution to the organisation of the 2nd IEEE ESTC conference (2008)
Recognition
- Senior Member of the Institute of Electrical and Electronics Engineers (IEEE)
- Fellow of the Higher Education Academy (FHEA)
- Member of IEEE Electronics Packaging Society (EPS)
- Member of the Steering Committee of the IEEE International Spring Seminar on Electronics Technology (ISSE)
- Member of the technical committees of IEEE International conferences: ESTC, ISSE, EMPC and EuroSIME
- Invited Lecturer on Erasmus-Mundus MSc in Smart System Integration at Heriot-Watt University (Edinburgh), HSN University College of Southeast Norway and Budapest University of Technology and Economics in Hungary (BME)
- Reviewer for the IEEE Trans. CPMT, MDPI Energies, Journal of Intelligent Manufacturing (Elsevier), IEEE-EPS conferences, and others.
Research / Scholarly interests
Main Research Areas
- Computational Engineering
- Virtual prototyping: development & application of computational models for numerical analysis and prediction of the performance of manufacturing processes, materials, and engineering products
- Finite element analysis and physics-of-failure modelling; Reliability engineering
- Numerical optimisation, Prognostics and Health Management (PHM)
- Computational Intelligence and Data Analytics
- Predictive analytics and machine learning, Deep Learning, and Data-driven modelling.
Current and New Research Projects
- VP-PEM: Real-time Virtual Prototypes for the Power Electronics Supply Chain Modules
- Co-I (UoG PI), EPSRC (EP/W006642/1), 07/23-06/26
- Partners: University of Nottingham (lead) and four industrial partners.
- MIRELAI: Microelectronics Reliability driven by Artificial Intelligence (EU Horizon-MSCA-DN)
- UoG PI, Work-package Lead and Lead Supervisor of the UoG Doctorate Project
Funded through UKRI (EPSRC, EP/X030148/1), 10/22-09/26 - Partners: 21 organisations (TU-Delft, IMEC, Bosch, Siemens, etc.) from 7 European countries.
- UoG PI, Work-package Lead and Lead Supervisor of the UoG Doctorate Project
- DAAP-PEM: Closed Loop Digitalised Data Analytics and Analysis Platform for Power Modules
- PI & Project Lead, EPSRC (EP/W006642/1), 04/22-09/24
- Partners: University of York and University of Liverpool, and Dynex Semiconductors.
- PHASOR: Model-based Assessment of the Thermal Fatigue Performance of ASIC Variants
- PI, Hanwha-Phasor (industry) funding.
Past Projects
- Going Global India - Exploratory Grant
- Co-I, British Council funding (IND/CONT/G/21-22/35), 2022
- Partners: Indian Institute of Technology (IIT) Kharagpur and Jadavpur University, India
- AI-enabled Modelling of Layered Composites
- PI, UoG internal funding (Proof-of-Concept), 2020-2021
- Multi-scale micromechanics modelling of SAC305 solders:
- UoG Co-I, EPSRC funding (EP/R019207), 2018-2021
- Partners: Imperial College London, Ford Motor Co, Nihon Superior, Rolls-Royce Plc (UK)
- Reliability Prediction Analysis for Solder Joint integrity
- Co-PI, GDAIS & DMEA (USA) and Leonardo-UK (industry) funding (HQ727-16-D-0003), 2013-2018
- THEIA (Technically high element alignment for Focal Plane Arrays):
- UoG Co-I, Innovate-UK funding (84066-518163), 2017-2018
- Partners: Microchip Technology and Amethyst Research
- Next Factory (3D Printing of Electronics)
- UoG Co-I, FP7 EU funding (ID 608985), 2014-2017
- Partners: IPA Fraunhofer, Uni Technologies, Microsemi, Acreo, and others
- Technology Assessment on the Effects of Refinishing Lead-Free Microelectronic Components
- Co-I, DMEA (Department of Defence, USA) funding (H94003-04-D-003-0056), 2010-2014
- Partners: Selex ES, Rolls Royce, Airbus Defence and Space, Micross Components
PhD Student Supervision
Research topics of supervised PhD programmes include:
- Microelectronics reliability driven by AI
- Model order reduction for reliability predictions of electronic components
- Predicting Degradation of Lithium-Ion Battery with Physics-Informed Machine Learning
- Computational Data Analysis and Prognostics for Smart Testing of Electronic Products
- Mathematical Modelling and Condition Based Monitoring of 3D Inkjet Printing Process
- Diagnostic and Prognostic Tools for Monitoring Degradation in Aged Structures
Selected Consultancy Projects
- Modelling the impact of embedding Cu coin into PCB on component reliability, funded by Leonardo, UK (2019)
- FEA of BGA package, funded by Tessera, USA (2015)
- Solder Interconnection Reliability Study, funded by GE Aviation, UK (2015)
- Printed Circuit Board Analysis of CBGA, funded by Cassidian Electronics, Germany (2013)
Teaching
Lecturer on UoG MSc programmes (2006-2018)
- MSc Applicable Mathematics, CMS, 2012-2018, Module MATH-1130, Reliability and Optimisation
- MSc Applied Mathematical Modelling and Scientific Computing, CMS, 2006-2012, Module MATH-1081, Reliability and Risk Analysis in Design
Recent publications
Article
Yang, Xingyu , Zhang, Zijian, Li, Xinhua, Lin, Hungyen , Lawman, Samuel , Stoyanov, Stoyan , Tilford, Timothy , Hu, Yihua , Shen, Yaochun , Zheng, Yalin (2024), . Elsevier. In: , , , . Elsevier, Optics and Lasers in Engineering, 184: 108631 (PART 1) ISSN: 0143-8166 (Print), 1873-0302 (Online) (doi: https://doi.org/10.1016/j.optlaseng.2024.108631).
Rawal, Aditi , Mason, Peter, Stoyanov, Stoyan, Bailey, Chris , Huber, Jurgen (2024), . Taylor and Francis Group - Routledge. In: , , , . Taylor and Francis Group - Routledge, Journal of the Institute of Conservation . pp. 1-20 ISSN: 1945-5224 (Print), 1945-5232 (Online) (doi: https://doi.org/10.1080/19455224.2024.2347202).
Xian, Jingwei , Xu, Yilun, Stoyanov, Stoyan, Coyle, Richard , Dunne, Fionn P. E. , Gourlay, Christopher (2024), . Nature Publishing Group. In: , , , . Nature Publishing Group, Nature Communications, 15: 4258 . pp. 1-15 ISSN: 2041-1723 (Print), (doi: https://doi.org/10.1038/s41467-024-48532-6).
Abdul Kareem, Razia Sulthana , Tilford, Timothy, Stoyanov, Stoyan (2024), . Elsevier. In: , , , . Elsevier, Computers in Biology and Medicine ISSN: 0010-4825 (Print), 1879-0534 (Online) (doi: https://doi.org/10.1016/j.compbiomed.2024.108528).
Hassan, Sheikh , Rajaguru, Pushparajah, Stoyanov, Stoyan, Bailey, Chris , Tilford, Timothy (2024), . Elsevier. In: , , , . Elsevier, Power Electronic Devices and Components: 100063 2772-3704 (Online) (doi: https://doi.org/10.1016/j.pedc.2024.100063).
Zhang, Xiaotian , Hu, Yihua, Zhang, Jingwei, Esfahani, Mohammad Nasr , Tilford, Tim , Stoyanov, Stoyan (2024), . Institute of Electrical and Electronics Engineers (IEEE). In: , , , . Institute of Electrical and Electronics Engineers (IEEE), IEEE Transactions on Industrial Electronics ISSN: 0278-0046 (Print), 1557-9948 (Online) (doi: https://doi.org/10.1109/TIE.2024.3368165).
Rajaguru, Pushpa , Tilford, Tim, Bailey, Chris, Stoyanov, Stoyan (2023), . Institute of Electrical and Electronics Engineers (IEEE). In: , , , . Institute of Electrical and Electronics Engineers (IEEE), IEEE Access ISSN: 2169-3536 (Print), (doi: https://doi.org/10.1109/ACCESS.2023.3342689).
Roy, Probir Kumar , Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley , Stoyanov, Stoyan , Ahsan, Mominul , Haider, Julfikar (2023), . MDPI. In: , , , . MDPI, Electronics, 12: 4105 (19) . pp. 1-30 2079-9292 (Online) (doi: https://doi.org/10.3390/electronics12194105).
Stoyanov, Stoyan , Bailey, Chris, Microchip Technology Inc., Amethyst Research (2023), . IEEE. In: , , , . IEEE, IEEE Access . pp. 35207-35219 2169-3536 (Online) (doi: https://doi.org/10.1109/ACCESS.2023.3264806).
Xu, Yilun , Xian, Jingwei, Stoyanov, Stoyan, Bailey, Christopher , Coyle, Richard , Gourlay, Christopher , Dunne, Fionn , Nokia Bell Labs, Murray Hill, New Jersey, USA (2022), . Elsevier. In: , , , . Elsevier, International Journal of Plasticity, 155: 103308 ISSN: 0749-6419 (Print), (doi: https://doi.org/10.1016/j.ijplas.2022.103308).
Tilford, Tim , Stoyanov, Stoyan, Braun, Jessica, Janhsen, Jan Christoph , Patel, Mayur K. , Bailey, Chris (2021), . IEEE. In: , , , . IEEE, IEEE Transactions on Components, Packaging and Manufacturing Technology, 11 (2) . pp. 351-362 ISSN: 2156-3950 (Print), 2156-3985 (Online) (doi: https://doi.org/10.1109/TCPMT.2021.3049952).
Stoyanov, Stoyan , Bailey, Christopher, Stewart, Paul, Parker, Mike , Roulston, John F. , Leonardo MW Ltd , Micross Components (2020), . IEEE. In: , , , . IEEE, IEEE Transactions on Components, Packaging and Manufacturing Technology, 10 (3) . pp. 502-515 ISSN: 2156-3950 (Print), 2156-3985 (Online) (doi: https://doi.org/10.1109/TCPMT.2020.2972635).
Ahsan, M. , Stoyanov, S., Bailey, C., Albarbar, A. (2020), . IEEE. In: , , , . IEEE, IEEE Access, 8 . pp. 16922-16933 2169-3536 (Online) (doi: https://doi.org/10.1109/ACCESS.2020.2967858).
Hinojosa Herrera, Ana Elsa , Stoyanov, Stoyan, Bailey, Christopher, Walshaw, Christopher , Yin, Chunyan (2019), . De Gruyter Open. In: , , , . De Gruyter Open, Open Computer Sciences, 9 (1) . pp. 200-211 2299-1093 (Online) (doi: https://doi.org/10.1515/comp-2019-0014).
Yin, Chunyan , Stoyanov, Stoyan, Bailey, Christopher, Stewart, Paul (2019), . IEEE. In: , , , . IEEE, IEEE Transactions on Components, Packaging and Manufacturing Technology, 9 (11) . pp. 2210-2218 ISSN: 2156-3950 (Print), 2156-3985 (Online) (doi: https://doi.org/10.1109/TCPMT.2019.2925874).
Stoyanov, Stoyan , Ahsan, Mominul, Bailey, Chris, Wotherspoon, Tracy , Hunt, Craig , Microchip Technology Inc. (2019), . Springer US. In: , , , . Springer US, Journal of Intelligent Manufacturing, 30 (3) . pp. 1497-1514 ISSN: 0956-5515 (Print), 1572-8145 (Online) (doi: https://doi.org/10.1007/s10845-018-01462-9).
Tilford, Tim , Stoyanov, Stoyan, Braun, Jessica, Janhsen, Jan Cristophe , Burgard, Matthias , Birch, Richard , Bailey, Chris , Fraunhofer Institute for Manufacturing Engineering and Automation IPA, Nobelstr. 12, Stuttgart, Germany , Microsemi Corporation, Castlegate Business Park, Caldicot, Monmouthshire, UK (2018), . Elsevier Ltd.. In: , , , . Elsevier Ltd., Microelectronics Reliability, 85 . pp. 109-117 ISSN: 0026-2714 (Print), (doi: https://doi.org/10.1016/j.microrel.2018.04.008).
Stoyanov, Stoyan , Bailey, Chris, Tourloukis, Georgios (2016), . Elsevier. In: , , , . Elsevier, Microelectronics Reliability, 67 . pp. 111-119 ISSN: 0026-2714 (Print), (doi: https://doi.org/10.1016/j.microrel.2016.10.017).
Book
Bailey, Christopher , Stoyanov, Stoyan, Lu, Hua (2017), . World Scientific Publishing. In: , , , Co-Design and Modelling for Advanced Integration and Packaging. World Scientific Publishing, . ISBN: 9789814740203ISSN: 2315-473X (Print), (doi: https://doi.org/10.1142/9900).
Conference proceedings
Hassan, Sheikh , Stoyanov, Stoyan, Rajaguru, Pushparajah, Bailey, Christopher (2024), . Institute of Electrical and Electronics Engineers (IEEE). In: 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC), 11th - 13th September, Berlin, Germany In: ESTC/IEEE 2024 Conference Committee (ed.), 2024 IEEE 10th Electronics System-Integration Technology Conference (ESTC). Institute of Electrical and Electronics Engineers (IEEE), Berlin, Germany; Piscataway, New Jersey (1st) . pp. 1-8 . ISBN: 9798350390360ISSN: 2687-9700 (Print), 2687-9727 (Online) (doi: https://doi.org/10.1109/ESTC60143.2024.10712079).
Stoyanov, Stoyan , Tilford, Tim, Shen, Yaochun, Hu, Yihua (2024), . Institute of Electrical and Electronics Engineers (IEEE). In: , , , 2024 47th International Spring Seminar on Electronics Technology (ISSE). Institute of Electrical and Electronics Engineers (IEEE), New Jersey, USA . pp. 1-7 . ISBN: 9798350385489ISSN: 2161-2536 (Print), 2161-2528 (Online) (doi: https://doi.org/10.1109/ISSE61612.2024.10604175).
Stoyanov, Stoyan , Tilford, Timothy, Zhang, Xiaotian, Hu, Yihua , Yang, Xingyu , Shen, Yaochun (2024), . Institute of Electrical and Electronics Engineers (IEEE). In: , , In: EuroSimE 2024 Conference committee (ed.), 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey (1st) . pp. 1-8 . ISBN: 9798350393644ISSN: 2833-8596 (Print), 2833-8553 (Online) (doi: https://doi.org/10.1109/EuroSimE60745.2024.10491522).
Hassan, Sheikh , Rajaguru, Pushparajah, Stoyanov, Stoyan, Bailey, Christopher (2024), . The Institute of Electrical and Electronics Engineers (IEEE). In: , , In: EMPC Conference Committee (ed.), 24th European Microelectronics and Packaging Conference & Exhibition (EMPC). 11-14 September 2023. Cambridge, United Kingdom. The Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey (1st) . pp. 1-6 . ISBN: 9780956808691; 9781665487368 (doi: https://doi.org/10.23919/EMPC55870.2023.10418328).
Hassan, Sheikh , Rajaguru, Pushparajah, Stoyanov, Stoyan, Bailey, Christopher (2023), . Institute of Electrical and Electronics Engineers IEEE. In: 2023 46th International Spring Seminar on Electronics Technology (ISSE), , In: ISSE International Spring Seminar on Electronics (ed.), 2023 46th International Spring Seminar on Electronics Technology (ISSE). 10th - 14th May 2023. Timisoara, Romania. Institute of Electrical and Electronics Engineers IEEE, Piscataway, NJ (1st) . pp. 1-7 . ISBN: 9798350334845; 9798350334852ISSN: 2161-2528 (Print), 2161-2536 (Online) (doi: https://doi.org/10.1109/ISSE57496.2023.10168468).
Stoyanov, Stoyan and , Bailey, Chris (2022), . Institute of Electrical and Electronics Engineers (IEEE). In: , , , 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey (1st) . pp. 1-7 . ISBN: 9781665458375 (doi: https://doi.org/10.1109/EuroSimE54907.2022.9758885).
Stoyanov, Stoyan , Stewart†, Paul, Bailey, Christopher (2021), . Institute of Electrical and Electronics Engineers (IEEE). In: , , In: Paul Stewart (ed.), 2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC). 13-16 Sept. 2021. Gothenburg, Sweden. Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey (1st) . pp. 1-8 . ISBN: 9780956808677 ; 9781665423687 (doi: https://doi.org/10.23919/EMPC53418.2021.9584970).
Stoyanov, Stoyan , Bailey, Christopher, Waite, Rhys, Hicks, Christopher , Golding, Terry , Microchip Technology Inc (Microsemi) , Amethyst Research Inc (2020), . IEEE. In: , , , 2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC). IEEE, . pp. 1-8 . ISBN: 9780956808660 (doi: https://doi.org/10.23919/EMPC44848.2019.8951842).
Hinojosa Herrera, Ana Elsa and , Stoyanov, Stoyan (2019), . IEEE Xplore. In: , , , Proceedings of the 2018 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE Xplore, . pp. 59-64 . ISBN: 9781538649046 (doi: https://doi.org/10.1109/iCCECOME.2018.8658941).
Ahsan, Mominul , Stoyanov, Stoyan, Bailey, Christopher (2018), . IEEE Xplore. In: , , , Proceedings of 41st Spring Seminar on Electronics Technology (ISSE). IEEE Xplore, . pp. 1-6 . ISBN: 9781538657300 2161-2536 (Online) (doi: https://doi.org/10.1109/ISSE.2018.8443612).
Stoyanov, Stoyan , Ahsan, Mominuil, Bailey, Chris (2018), . IEEE Xplore. In: , , , Proceedings EuroSimE 2018. IEEE Xplore, . pp. 1-9 . ISBN: 9781538623589 (doi: https://doi.org/10.1109/EuroSimE.2018.8369926).
Yin, Chunyan , Stoyanov, Stoyan, Bailey, Christopher, Stewart, Paul (2017), . IEEE. In: , , , 2017 18th International Conference on Electronic Packaging Technology (ICEPT). IEEE, . pp. 1021-1026 . ISBN: 9781538629734 (doi: https://doi.org/10.1109/ICEPT.2017.8046616).
Stoyanov, Stoyan and , Bailey, Christopher (2017), . IEEE. In: , , , Proceedings 2017 40th International Spring Seminar on Electronics Technology (ISSE). IEEE, . ISBN: 9781538605837 2161-2536 (Online) (doi: https://doi.org/10.1109/ISSE.2017.8000936).
Tilford, T. , Stoyanov, S., Tourloukis, G., Bailey, C. (2016), . IEEE. In: , , , 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). IEEE, . pp. 1-7 . ISBN: 9781509021062 (doi: https:// doi.org/10.1109/EuroSimE.2016.7463358).
Bailey, C. , Stoyanov, S., Tilford, T., Tourloukis, G. (2016), . Fraunhofer Verlag. In: , , In: Bernhard Müller (ed.), 3rd Fraunhofer Direct Digital Manufacturing Conference, DDMC 2016. Proceedings. Fraunhofer Verlag, Stuttgart . ISBN: 9783839691281 978-3-8396-1001-5 (Online) (doi: https://www.verlag.fraunhofer.de/bookshop/artikel.jsp?v=245111).